Accès libre

Optical Probe Current Sensor Module Using the Kerr Effect of Exchange-Coupled Magnetic Film and its Application to Igbt Switching Current Measurements

À propos de cet article

Citez

K. Ogawa
Spin Device Technology Center Shinshu University NaganoNagano, Japan
S. Suzuki
Spin Device Technology Center Shinshu University NaganoNagano, Japan
M. Sonehara
Spin Device Technology Center Shinshu University NaganoNagano, Japan
T. Sato
Spin Device Technology Center Shinshu University NaganoNagano, Japan
K. Asanuma
Department of Production Engineering Nagano Prefectural Institute of Technology UedaNagano, Japan
eISSN:
1178-5608
Langue:
Anglais
Périodicité:
Volume Open
Sujets de la revue:
Engineering, Introductions and Overviews, other