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Local temperature rise during the electron beam characterization Calculation model for the AlxGa1-xN at low dimensions

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[1] MORKOÇ H., STRITE S., GAO G.B., LIN M.E., SVERDLOV B., BURNS M., J. Appl. Phys., 76 (1994), 1363. Search in Google Scholar

[2] GOLDBERGER J., HE R., ZHANG Y., LEE S., YAN H., CHOI H.J., YANG P., Nature, 422 (2003), 599. Search in Google Scholar

[3] BARJON J., BRAULT J., DAUDIN B., JALABERT D., SIEBER B., J. Appl. Phys., 94 (2003), 2755. Search in Google Scholar

[4] GELHAUSEN O., PHILLIPS M.R., TOTH M., J. Appl. Phys., 89 (2001), 3535. Search in Google Scholar

[5] FLEISCHER K., TOTH M., PHILLIPS M.R., ZOU J., LI G., CHUA S.J., Appl. Phys. Lett., 74 (1999), 1114. Search in Google Scholar

[6] YACOBI B.G., HOLT D.B., Cathodoluminescence Microscopy of Inorganic Solids, Plenum Press, New York, 1990. Search in Google Scholar

[7] TALMON Y., THOMAS E.L., J. Microsc.-Oxford, 111 (1977), 151. Search in Google Scholar

[8] TALMON Y., THOMAS E.L., J. Microsc.-Oxford, 113 (1978), 69. Search in Google Scholar

[9] RANDOLPH S., FOWLKES J., RACK P., J. Appl. Phys., 97 (2005), 124312. Search in Google Scholar

[10] NOUIRI A., CHAGUETMI S., BELABED N., Surf. Interface Anal., 38 (2006), 1153. Search in Google Scholar

[11] NOUIRI A., Res. J. Mater. Sci., 2(2014), 1. Search in Google Scholar

[12] NOUIRI A., LEGHRIB L., AOUATI R., Glob. J. Adv. Pure Appl. Sci., 6 (2015), 08. Search in Google Scholar

[13] PARK Y.S., PARK C.M., LEE S.J., KANG T.W., J. Appl. Phys., 97 (2005), 073516. Search in Google Scholar

[14] REUTER P., RATH T., FISCHEREDER A., TRIMMEL G., HADLEY P., Scanning, 33 (2011), 1. Search in Google Scholar

[15] LETHY K.J., EDWARDS P.R., LIU C., SHIELDS P.A., ALLSOPP D.W.E., MARTIN R.W., Semicond. Sci. Tech., 27 (2012), 085010. Search in Google Scholar

[16] BARIN I., KNACKE O., KUBASCHEWSKI O., Thermochemical Properties of Inorganic Substances, Springer-Verlag, Berlin, 1977. Search in Google Scholar

[17] WEILI L., ALEXANDER A.B., Appl. Phys. Lett., 85 (2004), 5230. Search in Google Scholar

[18] KANAYA K., OKAYMA S., J. Phys. D Appl. Phys., 5 (1972), 43. Search in Google Scholar

[19] EVERHART T., HOFF P., J. Appl. Phys., 42 (1971), 5837. Search in Google Scholar

[20] WITTRY D.B., KYSER D.F., J. Appl. Phys., 38 (1967), 375. Search in Google Scholar

[21] AS D.J., POTTHAST S., KÖHLER U., KHARTCHENKO A., LISCHKA K., Mater. Res. Soc. Symp. Proc., 743 (2003), L5.4.1. Search in Google Scholar

eISSN:
2083-134X
Lingua:
Inglese
Frequenza di pubblicazione:
4 volte all'anno
Argomenti della rivista:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties