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Structural and optical characterization of annealed As30Te60Ga10 thin films prepared by thermal evaporation technique

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Cita

A.M. Abd-Elnaiem
Physics Department, Faculty of Science, Assiut University,Assiut, Egypt
M. Mohamed
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
R.M. Hassan
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
Physics Department, Faculty of Education-Zingiber, Aden University,Aden, Yemen
M.A. Abdel-Rahim
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
A.A. Abu-Sehly
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
M.M. Hafiz
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
eISSN:
2083-134X
Lingua:
Inglese
Frequenza di pubblicazione:
4 volte all'anno
Argomenti della rivista:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties