Uneingeschränkter Zugang

Structural and optical characterization of annealed As30Te60Ga10 thin films prepared by thermal evaporation technique


Zitieren

A.M. Abd-Elnaiem
Physics Department, Faculty of Science, Assiut University,Assiut, Egypt
M. Mohamed
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
R.M. Hassan
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
Physics Department, Faculty of Education-Zingiber, Aden University,Aden, Yemen
M.A. Abdel-Rahim
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
A.A. Abu-Sehly
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
M.M. Hafiz
Physics Department, Faculty of Science, Assiut University, 71516Assiut, Egypt
eISSN:
2083-134X
Sprache:
Englisch
Zeitrahmen der Veröffentlichung:
4 Hefte pro Jahr
Fachgebiete der Zeitschrift:
Materialwissenschaft, andere, Nanomaterialien, Funktionelle und Intelligente Materialien, Charakterisierung und Eigenschaften von Materialien