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Double-layer microwave absorber based on nanocrystalline CoFe2O4 and CoFe2O4/PANI multi-core/shell composites

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XRD patterns of samples S1, S2, S3 and S4.
XRD patterns of samples S1, S2, S3 and S4.

TEM (a, b, d, f) and SEM (c, e) images of the sample S1 (a), S2 (b), S3 (c, d) and S4 (e, f).
TEM (a, b, d, f) and SEM (c, e) images of the sample S1 (a), S2 (b), S3 (c, d) and S4 (e, f).

Schematic illustration of the synthesis process of CoFe2O4/PANI multi-core/shell composites.
Schematic illustration of the synthesis process of CoFe2O4/PANI multi-core/shell composites.

Hysteresis loops at room temperature for sample S2, S3 and S4.
Hysteresis loops at room temperature for sample S2, S3 and S4.

Variation of complex permittivity and permeability of sample S2, S3 and S4 with frequency.
Variation of complex permittivity and permeability of sample S2, S3 and S4 with frequency.

Sketch map of incidence of electromagnetic wave in multi-layer absorber.
Sketch map of incidence of electromagnetic wave in multi-layer absorber.

Absorption curves of the layers with thickness d = 2.0 mm (a), 2.5 mm (b), and variation of dielectric loss tangent (c) and magnetic loss tangent (d) of sample S2, S3 and S4 with frequency.
Absorption curves of the layers with thickness d = 2.0 mm (a), 2.5 mm (b), and variation of dielectric loss tangent (c) and magnetic loss tangent (d) of sample S2, S3 and S4 with frequency.

Absorption curves of the double-layer absorbers with a total layer thickness d = 2.0 mm (a), 2.5 mm (b).
Absorption curves of the double-layer absorbers with a total layer thickness d = 2.0 mm (a), 2.5 mm (b).

Microwave absorption properties of single layer (S2-S4) and double-layer (S5-S11) absorbers with total thickness of 2.0 mm and 2.5 mm.

SampleMaterialThickness [mm]Total thickness [mm]Min. R [dB]R peak [GHz]Bandwidth R < –10 dB [GHz]
S2Calcined ferrite2.02.0–3.211.7
2.52.5–4.811.8
S3Ferrite/PANI composite2.02.0–17.417.014.9 – 18.0 (3.1)
2.52.5–16.612.111.1 – 14.5 (3.4)
S4Ferrite/PANI composite2.02.0–19.016.214.1 – 18.0 (3.9)
2.52.5–23.613.110.8 – 14.5 (3.7)
S5Layer 1: S20.52.0–28.816.213.8 – 18.0 (4.2)
Layer 2: S41.5
S6Layer 1: S21.02.0–22.316.214.2 – 18.0 (3.8)
Layer 2: S41.0
S7Layer 1: S21.52.0–11.617.315.9 – 18.0 (2.1)
Layer 2: S40.5
S8Layer 1: S20.52.5–28.812.810.3 – 15.8 (5.5)
Layer 2: S42.0
S9Layer 1: S21.02.5–31.112.810.3 – 15.8 (5.5)
Layer 2: S41.5
S10Layer 1: S21.52.5–22.413.211.1 – 15.8 (4.7)
Layer 2: S41.0
S11Layer 1: S22.02.5–11.211.711.5 – 12.0 (0.5)
Layer 2: S40.5
eISSN:
2083-134X
Lingua:
Inglese
Frequenza di pubblicazione:
4 volte all'anno
Argomenti della rivista:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties