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Double-layer microwave absorber based on nanocrystalline CoFe2O4 and CoFe2O4/PANI multi-core/shell composites

Yewen Xu

Yewen Xu

Science and Technology on Near-Surface Detection LaboratoryWuxi, China
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Xu, Yewen
, 
Guozhu Shen

Guozhu Shen

Science and Technology on Near-Surface Detection LaboratoryWuxi, China
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Shen, Guozhu
, 
Hongyan Wu

Hongyan Wu

School of Physics and Optoelectronic Engineering, Nanjing University of Information Science & TechnologyNanjing, China
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Wu, Hongyan
, 
Bin Liu

Bin Liu

School of Physics and Optoelectronic Engineering, Nanjing University of Information Science & TechnologyNanjing, China
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Liu, Bin
, 
Xumin Fang

Xumin Fang

Science and Technology on Near-Surface Detection LaboratoryWuxi, China
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Fang, Xumin
, 
Ding Zhang

Ding Zhang

Science and Technology on Near-Surface Detection LaboratoryWuxi, China
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Zhang, Ding
 und 
Jun Zhu

Jun Zhu

Science and Technology on Near-Surface Detection LaboratoryWuxi, China
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Zhu, Jun
  
24. Feb. 2017
Double-layer microwave absorber based on nanocrystalline CoFe2O4 and CoFe2O4/PANI multi-core/shell composites's Cover Image
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Online veröffentlicht: 24. Feb. 2017
Seitenbereich: 94 - 104
Eingereicht: 23. Jan. 2016
Akzeptiert: 30. Nov. 2016
DOI: https://doi.org/10.1515/msp-2017-0010
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© 2017 Yewen Xu, Guozhu Shen, Hongyan Wu, Bin Liu, Xumin Fang, Ding Zhang, Jun Zhu
This article is distributed under the terms of the Creative Commons Attribution Non-Commercial License, which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.
XRD patterns of samples S1, S2, S3 and S4.
XRD patterns of samples S1, S2, S3 and S4.
TEM (a, b, d, f) and SEM (c, e) images of the sample S1 (a), S2 (b), S3 (c, d) and S4 (e, f).
TEM (a, b, d, f) and SEM (c, e) images of the sample S1 (a), S2 (b), S3 (c, d) and S4 (e, f).
Schematic illustration of the synthesis process of CoFe2O4/PANI multi-core/shell composites.
Schematic illustration of the synthesis process of CoFe2O4/PANI multi-core/shell composites.
Hysteresis loops at room temperature for sample S2, S3 and S4.
Hysteresis loops at room temperature for sample S2, S3 and S4.
Variation of complex permittivity and permeability of sample S2, S3 and S4 with frequency.
Variation of complex permittivity and permeability of sample S2, S3 and S4 with frequency.
Sketch map of incidence of electromagnetic wave in multi-layer absorber.
Sketch map of incidence of electromagnetic wave in multi-layer absorber.
Absorption curves of the layers with thickness d = 2.0 mm (a), 2.5 mm (b), and variation of dielectric loss tangent (c) and magnetic loss tangent (d) of sample S2, S3 and S4 with frequency.
Absorption curves of the layers with thickness d = 2.0 mm (a), 2.5 mm (b), and variation of dielectric loss tangent (c) and magnetic loss tangent (d) of sample S2, S3 and S4 with frequency.
Absorption curves of the double-layer absorbers with a total layer thickness d = 2.0 mm (a), 2.5 mm (b).
Absorption curves of the double-layer absorbers with a total layer thickness d = 2.0 mm (a), 2.5 mm (b).

Microwave absorption properties of single layer (S2-S4) and double-layer (S5-S11) absorbers with total thickness of 2_0 mm and 2_5 mm_

SampleMaterialThickness [mm]Total thickness [mm]Min. R [dB]R peak [GHz]Bandwidth R < –10 dB [GHz]
S2Calcined ferrite2.02.0–3.211.7–
2.52.5–4.811.8–
S3Ferrite/PANI composite2.02.0–17.417.014.9 – 18.0 (3.1)
2.52.5–16.612.111.1 – 14.5 (3.4)
S4Ferrite/PANI composite2.02.0–19.016.214.1 – 18.0 (3.9)
2.52.5–23.613.110.8 – 14.5 (3.7)
S5Layer 1: S20.52.0–28.816.213.8 – 18.0 (4.2)
Layer 2: S41.5
S6Layer 1: S21.02.0–22.316.214.2 – 18.0 (3.8)
Layer 2: S41.0
S7Layer 1: S21.52.0–11.617.315.9 – 18.0 (2.1)
Layer 2: S40.5
S8Layer 1: S20.52.5–28.812.810.3 – 15.8 (5.5)
Layer 2: S42.0
S9Layer 1: S21.02.5–31.112.810.3 – 15.8 (5.5)
Layer 2: S41.5
S10Layer 1: S21.52.5–22.413.211.1 – 15.8 (4.7)
Layer 2: S41.0
S11Layer 1: S22.02.5–11.211.711.5 – 12.0 (0.5)
Layer 2: S40.5
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