Accès libre

Local Detection Of Defects From Image Sequences

International Journal of Applied Mathematics and Computer Science's Cover Image
International Journal of Applied Mathematics and Computer Science
Issues in Fault Diagnosis and Fault Tolerant Control (special issue), Józef Korbicz and Dominique Sauter (Eds.)
À propos de cet article

Citez

Ewaryst Rafajłowicz
Institute of Computer Engineering, Control and Robotics, Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland
Marek Wnuk
Institute of Computer Engineering, Control and Robotics, Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland
Wojciech Rafajłowicz
Institute of Computer Engineering, Control and Robotics, Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland
ISSN:
1641-876X
Langue:
Anglais
Périodicité:
4 fois par an
Sujets de la revue:
Mathematics, Applied Mathematics