Accès libre

Local Detection Of Defects From Image Sequences

International Journal of Applied Mathematics and Computer Science's Cover Image
International Journal of Applied Mathematics and Computer Science
Issues in Fault Diagnosis and Fault Tolerant Control (special issue), Józef Korbicz and Dominique Sauter (Eds.)
À propos de cet article

Citez

ISSN:
1641-876X
Langue:
Anglais
Périodicité:
4 fois par an
Sujets de la revue:
Mathematics, Applied Mathematics