<abstract xml:lang="en" xmlns="http://www.w3.org/1999/xhtml"><p>Results of the comprehensive morphological study of CdI2-BiI3 layered crystals are presented. Direct AFM observations of micro- and nanostructures formed in the volume of the crystals confirm the predictions made on the basis of positron annihilation spectroscopy studies. The model explaining the possible pores formation mechanism is proposed and validated by the results of luminescence measurements at 8 K.</p></abstract>

Results of the comprehensive morphological study of CdI2-BiI3 layered crystals are presented. Direct AFM observations of micro- and nanostructures formed in the volume of the crystals confirm the predictions made on the basis of positron annihilation spectroscopy studies. The model explaining the possible pores formation mechanism is proposed and validated by the results of luminescence measurements at 8 K.

Studies of CdI2-Bi3 microstructures with optical methods, atomic force microscopy and positron annihilation spectroscopy

Ivan Franko National University of Lviv, Lviv, Ukraine

Lviv Polytechnic National University, Lviv, Ukraine

Materials Science-Poland

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Results of the comprehensive morphological study of CdI2-BiI3 layered crystals are presented. Direct AFM observations of micro- and nanostructures formed in...

Studies of CdI2-Bi3 microstructures with optical methods, atomic force microscopy and positron annihilation spectroscopy

Publié en ligne: 17 oct. 2014

Pages: 391 - 395

DOI: https://doi.org/10.2478/s13536-014-0215-z

Mots clés
layered crystals, microstructures, atomic force microscopy, positron annihilation

© 2014 Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Studies of CdI2-Bi3 microstructures with optical methods, atomic force microscopy and positron annihilation spectroscopy

Publié en ligne: 17 oct. 2014

Pages: 391 - 395

DOI: https://doi.org/10.2478/s13536-014-0215-z

Mots cléslayered crystals, microstructures, atomic force microscopy, positron annihilation

© 2014 Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Mots clés
layered crystals, microstructures, atomic force microscopy, positron annihilation