Studies of CdI2-Bi3 microstructures with optical methods, atomic force microscopy and positron annihilation spectroscopy

Publicado en línea: 17 oct 2014

Páginas: 391 - 395

DOI: https://doi.org/10.2478/s13536-014-0215-z

Palabras clave

layered crystals, microstructures, atomic force microscopy, positron annihilation

© 2014 Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.