<abstract xmlns="http://www.w3.org/1999/xhtml"><p>The trace element analysis system is presented using Proton Induced X-ray Emission (PIXE) analysis at a new Ion Beam Centre in Trnava. Standard PIXE system dedicated to the measurement of thick solid samples was extended by a new application for trace element analysis in aerosol samples. The sample holder was modified with respect to the dimensions of the aerosol filters, and a new sample holder and a Faraday cup (FC) were made. The first results of the PIXE aerosol analysis are presented in this paper. Furthermore, the geometric efficiency of the detection system was verified using 55Fe radioactive source emitting monoenergetic Mn X-ray lines. The measured data were compared with the Monte Carlo simulations regarding/disregarding the X-ray attenuation.</p></abstract>

The trace element analysis system is presented using Proton Induced X-ray Emission (PIXE) analysis at a new Ion Beam Centre in Trnava. Standard PIXE system dedicated to the measurement of thick solid samples was extended by a new application for trace element analysis in aerosol samples. The sample holder was modified with respect to the dimensions of the aerosol filters, and a new sample holder and a Faraday cup (FC) were made. The first results of the PIXE aerosol analysis are presented in this paper. Furthermore, the geometric efficiency of the detection system was verified using 55Fe radioactive source emitting monoenergetic Mn X-ray lines. The measured data were compared with the Monte Carlo simulations regarding/disregarding the X-ray attenuation.

Trace Elements Analysis by Pixe Spectroscopy

Slovak University Of Technology In Bratislava

Faculty Of Materials Science And Technology In Trnava, Advanced Technologies Research Institute

Research Papers Faculty of Materials Science and Technology Slovak University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

{"article-title":"Trace Elements Analysis by Pixe Spectroscopy"}

The trace element analysis system is presented using Proton Induced X-ray Emission (PIXE) analysis at a new Ion Beam Centre in Trnava. Standard PIXE system...

Trace Elements Analysis by Pixe Spectroscopy

Publié en ligne: 23 févr. 2019

Pages: 25 - 32

Reçu: 04 juin 2018

Accepté: 13 déc. 2018

DOI: https://doi.org/10.2478/rput-2018-0027

Mots clés
PIXE, trace elements, ion beam, aerosol, geometric efficiency

© 2018 Matúš Beňo et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Trace Elements Analysis by Pixe Spectroscopy

Publié en ligne: 23 févr. 2019

Pages: 25 - 32

Reçu: 04 juin 2018

Accepté: 13 déc. 2018

DOI: https://doi.org/10.2478/rput-2018-0027

Mots clésPIXE, trace elements, ion beam, aerosol, geometric efficiency

© 2018 Matúš Beňo et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Mots clés
PIXE, trace elements, ion beam, aerosol, geometric efficiency