<abstract xmlns="http://www.w3.org/1999/xhtml">

<p>This paper describes an experimental setup used at the Czech Metrology Institute (CMI) to measure the specific power loss of oriented and non-oriented electrical steel sheets up to 1 kHz using an Epstein frame. Special attention is given to a) a description of the hardware that is used, b) a description of the feedback control and measurement software, and c) an analysis of the sources of uncertainty and validation. Calibration expanded uncertainty of (0.5 up to 1.6)% for k = 2 can be achieved with this setup.</p>
</abstract>

This paper describes an experimental setup used at the Czech Metrology Institute (CMI) to measure the specific power loss of oriented and non-oriented electrical steel sheets up to 1 kHz using an Epstein frame. Special attention is given to a) a description of the hardware that is used, b) a description of the feedback control and measurement software, and c) an analysis of the sources of uncertainty and validation. Calibration expanded uncertainty of (0.5 up to 1.6)% for k = 2 can be achieved with this setup.

An Experimental Setup for Power Loss Measurement up to 1 kHz using an Epstein Frame at CMI

Department of Electromagnetic Measurement

Measurement Science Review

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

This paper describes an experimental setup used at the Czech Metrology Institute (CMI) to measure the specific power loss of oriented and non-oriented...

An Experimental Setup for Power Loss Measurement up to 1 kHz using an Epstein Frame at CMI

Publié en ligne: 17 nov. 2023

Pages: 275 - 280

Reçu: 13 juil. 2023

Accepté: 27 oct. 2023

DOI: https://doi.org/10.2478/msr-2023-0035

Mots clés
Epstein, feedback, measurement, power loss, reference sample, uncertainty

© 2023 Michal Ulvr, published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

An Experimental Setup for Power Loss Measurement up to 1 kHz using an Epstein Frame at CMI

Publié en ligne: 17 nov. 2023

Pages: 275 - 280

Reçu: 13 juil. 2023

Accepté: 27 oct. 2023

DOI: https://doi.org/10.2478/msr-2023-0035

Mots clésEpstein, feedback, measurement, power loss, reference sample, uncertainty

© 2023 Michal Ulvr, published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Mots clés
Epstein, feedback, measurement, power loss, reference sample, uncertainty