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Development of Liquid Crystal Layer Thickness and Refractive Index Measurement Methods for Scattering Type Liquid Crystal Displays

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A. Ozols
EuroLCDs SIA, 2 Ventspils High Technology Park Ventspils, Latvia
G. Mozolevskis
Institute of Solid State Physics University of LatviaRiga, Latvia
R. Zalubovskis
Latvian Institute of Organic Synthesis Riga, Latvia
M. Rutkis
Institute of Solid State Physics University of LatviaRiga, Latvia
eISSN:
2255-8896
Langue:
Anglais
Périodicité:
6 fois par an
Sujets de la revue:
Physics, Technical and Applied Physics