Open Access

Development of Liquid Crystal Layer Thickness and Refractive Index Measurement Methods for Scattering Type Liquid Crystal Displays


Cite

A. Ozols
EuroLCDs SIA, 2 Ventspils High Technology Park Ventspils, Latvia
G. Mozolevskis
Institute of Solid State Physics University of LatviaRiga, Latvia
R. Zalubovskis
Latvian Institute of Organic Synthesis Riga, Latvia
M. Rutkis
Institute of Solid State Physics University of LatviaRiga, Latvia
eISSN:
2255-8896
Language:
English
Publication timeframe:
6 times per year
Journal Subjects:
Physics, Technical and Applied Physics