A novel temperature controller for in-situ measurement of radiation-induced changes in temperature effects on space electronics

Publié en ligne: 18 juil. 2019

Pages: 227 - 235

Reçu: 02 mars 2019

DOI: https://doi.org/10.2478/jee-2019-0031

Mots clés

automated test equipment, thermoelectric cooler, thermometers, test software, test methods, temperature effects, RADFET, TID, PMOS, temperature coefficients, MTC

© 2019 Jiri Haze et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.