<abstract xmlns="http://www.w3.org/1999/xhtml"><p>The paper discusses a novel temperature controller and a related test method allowing in-situ measurement of total ionising dose-induced changes in the impact of temperature on electronic devices for space applications. Various results of pilot radiation experiments (testing commercial PMOS transistors, RADFETs, and voltage references) are also presented.</p></abstract>

The paper discusses a novel temperature controller and a related test method allowing in-situ measurement of total ionising dose-induced changes in the impact of temperature on electronic devices for space applications. Various results of pilot radiation experiments (testing commercial PMOS transistors, RADFETs, and voltage references) are also presented.

A novel temperature controller for in-situ measurement of radiation-induced changes in temperature effects on space electronics

Journal of Electrical Engineering

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

The paper discusses a novel temperature controller and a related test method allowing in-situ measurement of total ionising dose-induced changes in the impact...

A novel temperature controller for in-situ measurement of radiation-induced changes in temperature effects on space electronics

Online veröffentlicht: 18. Juli 2019

Seitenbereich: 227 - 235

Eingereicht: 02. März 2019

DOI: https://doi.org/10.2478/jee-2019-0031

Schlüsselwörter
automated test equipment, thermoelectric cooler, thermometers, test software, test methods, temperature effects, RADFET, TID, PMOS, temperature coefficients, MTC

© 2019 Jiri Haze et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

A novel temperature controller for in-situ measurement of radiation-induced changes in temperature effects on space electronics

Online veröffentlicht: 18. Juli 2019

Seitenbereich: 227 - 235

Eingereicht: 02. März 2019

DOI: https://doi.org/10.2478/jee-2019-0031

Schlüsselwörterautomated test equipment, thermoelectric cooler, thermometers, test software, test methods, temperature effects, RADFET, TID, PMOS, temperature coefficients, MTC

© 2019 Jiri Haze et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Schlüsselwörter
automated test equipment, thermoelectric cooler, thermometers, test software, test methods, temperature effects, RADFET, TID, PMOS, temperature coefficients, MTC