Ac Impedance Spectroscopy Of Al/A-Sic/C–Si(P)/Al Heterostructure under Illumination
, , , , et | 17 juin 2014
À propos de cet article
Publié en ligne: 17 juin 2014
Pages: 174 - 178
Reçu: 24 oct. 2013
DOI: https://doi.org/10.2478/jee-2014-0027
Mots clés
© Faculty of Electrical Engineering and Information Technology, Slovak University of Technology
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The amorphous silicon carbide/crystalline silicon heterojunction was prepared and analyzed. The current-voltage (I − V ) measurements showed the barrier properties of prepared sample. Biased impedance spectra of Al/a-SiC/c-Si(p)/Al heterojunction under the standard illumination are reported and analyzed. AC measurements in the illuminated conditions were processed in order to identify electronic behavior using equivalent AC circuit which was suggested and obtained by fitting the measured impedance data. A phenomenon of negative capacitance/resistance in certain frequency range has been observed.