<abstract xmlns="http://www.w3.org/1999/xhtml"><p>A procedure for the identification of lumped models of distributed parameter electromagnetic systems is presented in this paper. A Frequency Response Analysis (FRA) of the device to be modeled is performed, executing repeated measurements or intensive simulations. The method can be used to extract the values of the components. The fundamental brick of this architecture is a multi-valued neuron (MVN), used in a multilayer neural network (MLMVN); the neuron is modified in order to use arbitrary complex-valued inputs, which represent the frequency response of the device. It is shown that this modification requires just a slight change in the MLMVN learning algorithm. The method is tested over three completely different examples to clearly explain its generality.</p></abstract>

A procedure for the identification of lumped models of distributed parameter electromagnetic systems is presented in this paper. A Frequency Response Analysis (FRA) of the device to be modeled is performed, executing repeated measurements or intensive simulations. The method can be used to extract the values of the components. The fundamental brick of this architecture is a multi-valued neuron (MVN), used in a multilayer neural network (MLMVN); the neuron is modified in order to use arbitrary complex-valued inputs, which represent the frequency response of the device. It is shown that this modification requires just a slight change in the MLMVN learning algorithm. The method is tested over three completely different examples to clearly explain its generality.

A MLMVN with Arbitrary Complex-Valued Inputs and a Hybrid Testability Approach for the Extraction of Lumped Models Using FRA

Journal of Artificial Intelligence and Soft Computing Research

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

A procedure for the identification of lumped models of distributed parameter electromagnetic systems is presented in this paper. A Frequency Response Analysis...

A MLMVN with Arbitrary Complex-Valued Inputs and a Hybrid Testability Approach for the Extraction of Lumped Models Using FRA

Publié en ligne: 20 août 2018

Pages: 5 - 19

Reçu: 28 mai 2017

Accepté: 19 oct. 2017

DOI: https://doi.org/10.2478/jaiscr-2018-0021

Mots clés
Analog circuits, Complex-valued neural networks, Lumped models, Testability

© 2019 Igor Aizenberg et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

A MLMVN with Arbitrary Complex-Valued Inputs and a Hybrid Testability Approach for the Extraction of Lumped Models Using FRA

Publié en ligne: 20 août 2018

Pages: 5 - 19

Reçu: 28 mai 2017

Accepté: 19 oct. 2017

DOI: https://doi.org/10.2478/jaiscr-2018-0021

Mots clésAnalog circuits, Complex-valued neural networks, Lumped models, Testability

© 2019 Igor Aizenberg et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Mots clés
Analog circuits, Complex-valued neural networks, Lumped models, Testability