Accès libre

Bivariate Hahn moments for image reconstruction

International Journal of Applied Mathematics and Computer Science's Cover Image
International Journal of Applied Mathematics and Computer Science
Signals and Systems (special section, pp. 233-312), Ryszard Makowski and Jan Zarzycki (Eds.)
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Haiyong Wu
Senlin Yan
School of Mathematics and Information Technology Xiaozhuang University, 211171 Nanjing, China
eISSN:
2083-8492
Langue:
Anglais
Périodicité:
4 fois par an
Sujets de la revue:
Mathematics, Applied Mathematics