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Bivariate Hahn moments for image reconstruction

International Journal of Applied Mathematics and Computer Science's Cover Image
International Journal of Applied Mathematics and Computer Science
Signals and Systems (special section, pp. 233-312), Ryszard Makowski and Jan Zarzycki (Eds.)
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eISSN:
2083-8492
Langue:
Anglais
Périodicité:
4 fois par an
Sujets de la revue:
Mathematics, Applied Mathematics