Accès libre

Artificial intelligence methods in diagnostics of analog systems

International Journal of Applied Mathematics and Computer Science's Cover Image
International Journal of Applied Mathematics and Computer Science
Signals and Systems (special section, pp. 233-312), Ryszard Makowski and Jan Zarzycki (Eds.)
À propos de cet article

Citez

Piotr Bilski
Jacek Wojciechowski
Institute of Radioelectronics Warsaw University of Technology, ul. Nowowiejska 15/19, 00-665 Warsaw, Poland
eISSN:
2083-8492
Langue:
Anglais
Périodicité:
4 fois par an
Sujets de la revue:
Mathematics, Applied Mathematics