Accès libre

Device Application of Non-Equilibrium MOS Capacitors Fabricated on High Resistivity Silicon

À propos de cet article

Citez

S. Sze, “Physics of Semiconductor Devices”, Eds. New York: John Wiley & Sons, pp. 407-430, 1981. Search in Google Scholar

D. Schroder, “Semiconductor Material and Devices Characterization”, Eds. New York: John Wiley & Sons, pp. 405-423, 1990. Search in Google Scholar

P. Peykov, J. Carrillo, and M. Aceves, “Triangular-voltage Sweep C-V Method for Determination of Generation Lifetime and Surface Generation Velocity”, Solid-State Electronics, vol. 36, No. 1, pp. 99-102, January 1993.10.1016/0038-1101(93)90074-Z Search in Google Scholar

X. Zhang, “Rapid Interpretation of the Linear Sweep MOS C-t Transients”, Semicond. Sci. Technol. vol. 9, pp. 1511-1514, 1994. Search in Google Scholar

S. Roland, “Double-sweep LF-CV technique for generation rate determination in MOS capacitors”, Solid-State Electronics, Vol. 38, No. 8, pp. 1479-1484, August 1995. Search in Google Scholar

A. Malik, M. Aceves, S. Alcantara, S., “Novel FTO/SRO/silicon optical sensors, characterization and applications”, Proceedings of IEEE Conference on Sensors, ISBN: 07803-7454-1, vol.1, pp. 116 – 120, Florida, USA, 2002. Search in Google Scholar

D. Koubao , Simple determination of the profile of bulk generation lifetime in semiconductor”, Solid-State Electronics, Vol. 46, No. 4, pp. 601-603, April 2002.10.1016/S0038-1101(01)00246-5 Search in Google Scholar

M. Tapajna, L. Harmatha, “Determining the Generation Lifetime in MOS Capacitors using Linear Sweep Techniques”, Solid-State Electronics, vol. 48, No.8, pp. 2339-2342, August 2004. Search in Google Scholar

S. Volkos, E. Efthymiou, S. Bernardini, I. Hawkins, A. Peaker, and G. Petkos, “The impact of negative-bias-temperature-instability on the carrier generation lifetime of metal- oxynitride-silicon capacitors”, J. Appl. Phys., Vol. 100, No.124, pp.103-112, 2006.10.1063/1.2402346Search in Google Scholar

eISSN:
1178-5608
Langue:
Anglais
Périodicité:
Volume Open
Sujets de la revue:
Engineering, Introductions and Overviews, other