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Measurement Science Review
Édition 18 (2018): Edition 6 (October 2018)
Accès libre
Proposed Use of Monte Carlo Simulated Images to Evaluate the Accuracy of Measurements on X-Ray Computed Tomography
Tomasz Kowaluk
Tomasz Kowaluk
,
Maciej Maciak
Maciej Maciak
,
Adam Woźniak
Adam Woźniak
,
Piotr Tulik
Piotr Tulik
et
Natalia Golnik
Natalia Golnik
| 30 nov. 2018
Measurement Science Review
Édition 18 (2018): Edition 6 (October 2018)
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Publié en ligne:
30 nov. 2018
Pages:
251 - 255
Reçu:
08 mai 2018
Accepté:
03 nov. 2018
DOI:
https://doi.org/10.1515/msr-2018-0034
Mots clés
Monte Carlo Methods
,
X-ray computed tomography
,
accuracy of measurements
,
threshold values
© 2018 Tomasz Kowaluk et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
Tomasz Kowaluk
Institute of Metrology and Biomedical Engineering, Faculty of Mechatronics, Warsaw University of Technology
Warsaw, Poland
Maciej Maciak
Institute of Metrology and Biomedical Engineering, Faculty of Mechatronics, Warsaw University of Technology
Warsaw, Poland
Adam Woźniak
Institute of Metrology and Biomedical Engineering, Faculty of Mechatronics, Warsaw University of Technology
Warsaw, Poland
Piotr Tulik
Institute of Metrology and Biomedical Engineering, Faculty of Mechatronics, Warsaw University of Technology
Warsaw, Poland
Natalia Golnik
Institute of Metrology and Biomedical Engineering, Faculty of Mechatronics, Warsaw University of Technology
Warsaw, Poland