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Fig. 1
Temperature dependence of dielectric constant of NN-BT ceramics with different NaNbO3 contents, sintered at 1260 °C and measured at 1 kHz.
Fig. 2
Temperature dependence of dielectric permittivity of NN-BT ceramics at different sintering temperatures measured at 1 kHz. (a) real part, (b) dielectric loss.
Fig. 3
Temperature dependence of dielectric permittivity for the 1270 °C sintered NN-BT ceramics at different frequencies (a) real part of permittivity, dielectric loss.
Fig. 4
X-ray diffraction patterns of NN-BT ceramic samples.
Fig. 5
SEM images of cross-sections of NN-BT ceramic samples sintered at (a) 1250 °C, (b) 1260 °C, (c) 1270 °C, (d) 1280 °C and (e) 1290 °C.
Fig. 6
XPS of NN-BT samples sintered at 1250 °C and 1270 °C: (a) Ti 2p, (b) O 1s, (c) Ba 3d.