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Colossal dielectric constant of NaNbO3 doped BaTiO3 ceramics


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Fig. 1

Temperature dependence of dielectric constant of NN-BT ceramics with different NaNbO3 contents, sintered at 1260 °C and measured at 1 kHz.
Temperature dependence of dielectric constant of NN-BT ceramics with different NaNbO3 contents, sintered at 1260 °C and measured at 1 kHz.

Fig. 2

Temperature dependence of dielectric permittivity of NN-BT ceramics at different sintering temperatures measured at 1 kHz. (a) real part, (b) dielectric loss.
Temperature dependence of dielectric permittivity of NN-BT ceramics at different sintering temperatures measured at 1 kHz. (a) real part, (b) dielectric loss.

Fig. 3

Temperature dependence of dielectric permittivity for the 1270 °C sintered NN-BT ceramics at different frequencies (a) real part of permittivity, dielectric loss.
Temperature dependence of dielectric permittivity for the 1270 °C sintered NN-BT ceramics at different frequencies (a) real part of permittivity, dielectric loss.

Fig. 4

X-ray diffraction patterns of NN-BT ceramic samples.
X-ray diffraction patterns of NN-BT ceramic samples.

Fig. 5

SEM images of cross-sections of NN-BT ceramic samples sintered at (a) 1250 °C, (b) 1260 °C, (c) 1270 °C, (d) 1280 °C and (e) 1290 °C.
SEM images of cross-sections of NN-BT ceramic samples sintered at (a) 1250 °C, (b) 1260 °C, (c) 1270 °C, (d) 1280 °C and (e) 1290 °C.

Fig. 6

XPS of NN-BT samples sintered at 1250 °C and 1270 °C: (a) Ti 2p, (b) O 1s, (c) Ba 3d.
XPS of NN-BT samples sintered at 1250 °C and 1270 °C: (a) Ti 2p, (b) O 1s, (c) Ba 3d.
eISSN:
2083-134X
Sprache:
Englisch
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Materialwissenschaft, andere, Nanomaterialien, Funktionelle und Intelligente Materialien, Charakterisierung und Eigenschaften von Materialien