Patent Citations Analysis and Its Value in Research Evaluation: A Review and a New Approach to Map Technology-relevant Research
18 févr. 2017
À propos de cet article
Catégorie d'article: Expert Review
Publié en ligne: 18 févr. 2017
Pages: 13 - 50
Reçu: 23 nov. 2016
Accepté: 03 déc. 2016
DOI: https://doi.org/10.1515/jdis-2017-0002
Mots clés
© 2017 Anthony F.J. van Raan
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

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