On correction factors for profile measurements with small solid state detectors and with small ionization chambers

Publicado en línea: 02 abr 2025

Páginas: 51 - 61

Recibido: 31 jul 2024

Aceptado: 20 ene 2025

DOI: https://doi.org/10.2478/pjmpe-2025-0005

Palabras clave

Monte Carlo simulation, true profiles, averaging effects, profile correction factors, analytical correction function

© 2025 Suresh Poudel et al., published by Sciendo

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