<abstract xmlns="http://www.w3.org/1999/xhtml"><p> This paper focuses on the calibration of apertures for rectangular waveguides using open-short-load (OSL) standards and transmission-line (TL) approaches. The reflection coefficients that were measured using both calibration techniques were compared with the coefficients acquired using the thru-reflect-line (TRL) method. In this study, analogous relationships between the results of OSL calibration and TL calibration were identified. In the OSL calibration method, the theoretical, open-standard values are calculated from quasi-static integral models. The proposed TL calibration procedure is a simple, rapid, broadband approach, and its results were validated by using the OSL calibration method and by comparing the results with the calculated integral admittance. The quasi-static integral models were used to convert the measured reflection coefficients to relative permittivities for the infinite samples and the thin, finite samples</p></abstract>

This paper focuses on the calibration of apertures for rectangular waveguides using open-short-load (OSL) standards and transmission-line (TL) approaches. The reflection coefficients that were measured using both calibration techniques were compared with the coefficients acquired using the thru-reflect-line (TRL) method. In this study, analogous relationships between the results of OSL calibration and TL calibration were identified. In the OSL calibration method, the theoretical, open-standard values are calculated from quasi-static integral models. The proposed TL calibration procedure is a simple, rapid, broadband approach, and its results were validated by using the OSL calibration method and by comparing the results with the calculated integral admittance. The quasi-static integral models were used to convert the measured reflection coefficients to relative permittivities for the infinite samples and the thin, finite samples

Non-destructive Dielectric Measurements and Calibration for Thin Materials Using Waveguide-Coaxial Adaptors

Communication Engineering Department, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, 81310 UTM Skudai, Malaysia

Department of Physics, Faculty of Science, Universiti Putra Malaysia, 43400 UPM Serdang, Malaysia

School of Electrical Systems Engineering, Universiti Malaysia Perlis, Taman Seberang Jaya Fasa 3, Kuala Perlis,Perlis, Malaysia

School of Mechatronic Engineering, University Malaysia Perlis, Ulu Pauh Campus, 02600 Arau, Perlis, Malaysia

Measurement Science Review

This paper focuses on the calibration of apertures for rectangular waveguides using open-short-load (OSL) standards and transmission-line (TL) approaches. The...

Non-destructive Dielectric Measurements and Calibration for Thin Materials Using Waveguide-Coaxial Adaptors

Publicado en línea: 06 mar 2014

Páginas: 16 - 24

DOI: https://doi.org/10.2478/msr-2014-0003

This content is open access.