Development of Mathematical Models for Detecting Micron Scale Volumetric Defects in Thin Film Coatings

Publicado en línea: 20 may 2016

Páginas: 38 - 47

DOI: https://doi.org/10.1515/lpts-2016-0012

Palabras clave

deconvolution, compressive sampling, ℓ minimization, numeric simulation, thin film coatings

© 2016 G. Gaigals et al., published by De Gruyter Open

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.