<abstract xmlns="http://www.w3.org/1999/xhtml"><p>The paper describes structure and measurement results of the system detecting present maximum temperature on the surface of an integrated circuit. The system consists of the set of proportional to absolute temperature sensors, temperature processing path and a digital part designed in VHDL. Analogue parts of the circuit where designed with full-custom technique. The system is a part of temperature-controlled oscillator circuit - a power management system based on dynamic frequency scaling method. The oscillator cooperates with microprocessor dedicated for thermal experiments. The whole system is implemented in UMC CMOS 0.18 μm (1.8 V) technology.</p></abstract>

The paper describes structure and measurement results of the system detecting present maximum temperature on the surface of an integrated circuit. The system consists of the set of proportional to absolute temperature sensors, temperature processing path and a digital part designed in VHDL. Analogue parts of the circuit where designed with full-custom technique. The system is a part of temperature-controlled oscillator circuit - a power management system based on dynamic frequency scaling method. The oscillator cooperates with microprocessor dedicated for thermal experiments. The whole system is implemented in UMC CMOS 0.18 μm (1.8 V) technology.

Maximum Temperature Detection System for Integrated Circuits

AGH University of Science and Technology, Department of Electronics, Mickiewicza 30, 30-059 Cracow, Poland

Journal of Electrical Engineering

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

{"article-title":"Maximum Temperature Detection System for Integrated Circuits"}

The paper describes structure and measurement results of the system detecting present maximum temperature on the surface of an integrated circuit. The system...

Maximum Temperature Detection System for Integrated Circuits

Publicado en línea: 15 may 2015

Páginas: 79 - 84

Recibido: 11 mar 2014

DOI: https://doi.org/10.1515/jee-2015-0012

Palabras clave
TCO, DFS, VLSI, CMOS

© Faculty of Electrical Engineering and Information Technology, Slovak University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Maximum Temperature Detection System for Integrated Circuits

Publicado en línea: 15 may 2015

Páginas: 79 - 84

Recibido: 11 mar 2014

DOI: https://doi.org/10.1515/jee-2015-0012

Palabras claveTCO, DFS, VLSI, CMOS

© Faculty of Electrical Engineering and Information Technology, Slovak University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Palabras clave
TCO, DFS, VLSI, CMOS