<abstract xml:lang="en" xmlns="http://www.w3.org/1999/xhtml"><p>The paper presents the results of a feasibility study of measuring static parameters of ADC cores embedded in a System-on-Chip. Histogram based technique is employed because it is suitable for built-in self-test. While the theoretical background of the technique has been covered by numerous papers, less attention has been given to implementations in practice. Our goal was the implementation of histogram test in a IEEE Std 1500 wrapper. Two different solutions pursuing either minimal test time or minimal hardware overhead are described. The impact of MOS switches at ADC input on the performed measurements was considered.</p></abstract>

The paper presents the results of a feasibility study of measuring static parameters of ADC cores embedded in a System-on-Chip. Histogram based technique is employed because it is suitable for built-in self-test. While the theoretical background of the technique has been covered by numerous papers, less attention has been given to implementations in practice. Our goal was the implementation of histogram test in a IEEE Std 1500 wrapper. Two different solutions pursuing either minimal test time or minimal hardware overhead are described. The impact of MOS switches at ADC input on the performed measurements was considered.

Measuring Static Parameters of Embedded ADC Core

Jozef Stefan Institute, Jamova 39, 1000 Ljubljana, Slovenia

Journal of Electrical Engineering

{"article-title":"Measuring Static Parameters of Embedded ADC Core"}

The paper presents the results of a feasibility study of measuring static parameters of ADC cores embedded in a System-on-Chip. Histogram based technique is...

Measuring Static Parameters of Embedded ADC Core

Online veröffentlicht: 07. Juni 2011

Seitenbereich: 80 - 86

DOI: https://doi.org/10.2478/v10187-011-0013-3

Schlüsselwörter
ADC static parameters, histogram based test, built-in self-test, system-on-chip

This content is open access.

Measuring Static Parameters of Embedded ADC Core

Online veröffentlicht: 07. Juni 2011

Seitenbereich: 80 - 86

DOI: https://doi.org/10.2478/v10187-011-0013-3

SchlüsselwörterADC static parameters, histogram based test, built-in self-test, system-on-chip

This content is open access.

Schlüsselwörter
ADC static parameters, histogram based test, built-in self-test, system-on-chip