The Journal of Institute of Measurement Science of Slovak Academy of Sciences

Measurement Science Review

<abstract xml:lang="en"><title style='display:none'>Integral Nonlinearity Correction Algorithm Based on Error Table Optimizing and Noise Filtering</title>The main purpose of this paper is to present the external correction of analog to digital converters (ADC) integral nonlinearity and quantization noise based on the look up table method (LUT) combined with the averaging and Wiener filtering and dithering method. The LUT compression and LUT precision effect are also studied.</abstract>

Integral Nonlinearity Correction Algorithm Based on Error Table Optimizing and Noise Filtering

Department of Electrical Engineering and Measurement, Faculty of Electrical Engineering and Informatics, University of Košice, Park Komenského 13, 041 20 Košice, Slovakia

Keywords

<article-title>Integral Nonlinearity Correction Algorithm Based on Error Table Optimizing and Noise Filtering</article-title>

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Editor-in-Chief: Ivan Frollo, Institute of Measurement Science, Slovak Academy of Sciences, Slovakia Executive Editors: Viktor Witkovský, Institute of Measurement Science, Slovak Academy of Sciences, Slovakia Ida Prokopčáková, Institute of Experimental Psychology, Slovak Academy of Sciences, Slovakia Editor: Vladimír Juráš, Institute of Measurement Science, Slovak Academy of Sciences, Slovakia Editorial Board: Olli Aumala, Tampere University of Technology, Finland Denny Borsboom, Department of Psychology, University of Amsterdam, The Netherlands Isabel Van Driessche, Ghent University-Laboratory of Organometallics and Catalysis, Belgium Zoltán Domotor, Department of Philosophy, University of Pennsylvania, Philadelphia, U.S.A. Miroslav Dovica, Technical University of Košice, Slovakia Stanislav Duriš, Technical University Bratislava, Slovakia Osman Gencel, Faculty of Engineering, Bartin University, Bartin, Turkey Adam Glowacz, AGH University of Science and Technology, Poland Marco L. H. Gruwel, Department of Chemistry, University of Manitoba, Winnipeg, Canada Yuri V. Chugui, Technological Design Institute of Scientific Instrument Engineering, Russia Dietrich Hofmann, SpectroNet - International Collaboration Cluster, Jena, Germany Dariusz J. Jakóbczak, Technical University of Koszalin, Poland György Kozmann, CRIP Research Institute for Technical Physics and Material Science, Hungary Vitalij Novickij, Vilnius Gediminas Technical University, Lithuania Ignacio Lira, Pontificia Universidad Catolica de Chile, Chile Kalju Meigas, Tallinn University of Technology, Estonia Rosario Morello, University Mediterranea of Reggio Calabria, Italy Ganesh R. Naik, Faculty of Engng &amp; Inf. Technology Univ. of Technology, Sydney, Australia Irina G. Palchikova, Technological Design Institute of Scientific Instrument Engineering, Russia Rudolf Palenčár, Technical University Bratislava, Slovakia Nicola Pasquino, University of Naples Federico II, Napoli, Italy Sudheer Rani, Vanderbilt University Institute of Imaging Sciences, Nashville, U.S.A. Paul Regtien, Faculty of Electrical Engineering at the University of Twente, The Netherlands Mario Savino, Politecnico di BARI, Italy Viktor Smieško, Technical University Bratislava, Slovakia Harald Schumny, Physikalisch- Technische Bundesanstalt, Germany Manuch Soleimani, University of Bath, Claverton Down, Bath, UK Michael G. Sowa, Institute for Biodiagnostics, National Research Council of Canada, Canada Peter H. Sydenham, University of South Australia and GSEC Pty Ltd, Australia Zenon Starčuk, Institute of Scientific Instruments, Academy of Sciences, Czech Republic Mihai Tarata, Dept. of Med. Informatics, Uni. of Medicine and Pharmacy of Craiova, Romania Shigeru Takayama, Ritsumeikan University BKC, Faculty of Science and Engineering, Japan Milan Tyšler, Institute of Measurement Science , Slovak Academy of Sciences , Slovakia Julia Volaufova, Louisiana State University Health Sciences Center, New Orleans, U.S.A. Werner Wolf, Universität der Bundeswehr, München, Germany Jan Zakrzewski, Silesian Univ. of Technology, Dep. of Measurement and El. Control, Poland T. Yuvaraja, Channabasaveshwara Institute of Technology, Tumkur City, India Orest Kochan, Lviv Polytechnic National University, Lviv, Ukraine Tao Wang, Shanghai Jiao Tong University, Shanghai, China Language Editor: Ida Prokopčáková, Institute of Experimental Psychology, Slovak Academy of Sciences, Slovakia Technical Editors: Eva Nagyová, Institute of Measurement Science, Slovak Academy of Sciences, Slovakia Katarína Kozáková, Institute of Measurement Science, Slovak Academy of Sciences, Slovakia Contact: Institute of Measurement Science Slovak Academy of Sciences Dubravska 9. 841 04 BRATISLAVA Slovak Republic Tel: +4212 5910 4511 - secretary of the director, <A href="mailto:umersekr@savba.sk">umersekr@savba.sk</A> Fax: +4212 5910 4594 <A href="http://www.um.sav.sk/en/">www.um.sav.sk/en/</A> Publisher: De Gruyter Poland Bogumiła Zuga 32A Str. 01-811 Warsaw, Poland

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Measurement Science Review

Integral Nonlinearity Correction Algorithm Based on Error Table Optimizing and Noise Filtering

L. Michaeli,
L. Michaeli,
J. Šaliga und
J. Šaliga und
L. Sochová
L. Sochová

Online veröffentlicht: 06 May 2008

Volumen & Heft: Volumen 8 (2008) - Heft 2 (January 2008)

Seitenbereich: 29 - 32

Details zu Zeitschrift und Ausgabe

Measurement Science Review

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Measurement Science Review

Integral Nonlinearity Correction Algorithm Based on Error Table Optimizing and Noise Filtering

L. Michaeli,L. Michaeli,J. Šaliga undJ. Šaliga undL. SochováL. Sochová

Online veröffentlicht: 06 May 2008

Volumen & Heft: Volumen 8 (2008) - Heft 2 (January 2008)

Seitenbereich: 29 - 32

Details zu Zeitschrift und Ausgabe

Measurement Science Review

PDF-Vorschau

Referenzen

Neueste Artikel

L. Michaeli,
L. Michaeli,
J. Šaliga und
J. Šaliga und
L. Sochová
L. Sochová