<abstract xml:lang="en" xmlns="http://www.w3.org/1999/xhtml"><p>March tests are widely used in the process of RAM testing. This family of tests is very efficient in the case of simple faults such as stuck-at or transition faults. In the case of a complex fault model—such as pattern sensitive faults—their efficiency is not sufficient. Therefore we have to use other techniques to increase fault coverage for complex faults. Multibackground memory testing is one of such techniques. In this case a selected March test is run many times. Each time it is run with new initial conditions. One of the conditions which we can change is the initial memory background. In this paper we compare the efficiency of multibackground tests based on four different algorithms of background generation.</p></abstract>

March tests are widely used in the process of RAM testing. This family of tests is very efficient in the case of simple faults such as stuck-at or transition faults. In the case of a complex fault model—such as pattern sensitive faults—their efficiency is not sufficient. Therefore we have to use other techniques to increase fault coverage for complex faults. Multibackground memory testing is one of such techniques. In this case a selected March test is run many times. Each time it is run with new initial conditions. One of the conditions which we can change is the initial memory background. In this paper we compare the efficiency of multibackground tests based on four different algorithms of background generation.

Analysis of multibackground memory testing techniques

Institute of Computer Science, Białystok Technical University, Wiejska 45A, 15-351 Białystok, Poland

International Journal of Applied Mathematics and Computer Science

{"article-title":"Analysis of multibackground memory testing techniques"}

March tests are widely used in the process of RAM testing. This family of tests is very efficient in the case of simple faults such as stuck-at or transition...

Analysis of multibackground memory testing techniques

Online veröffentlicht: 25. März 2010

Seitenbereich: 191 - 205

DOI: https://doi.org/10.2478/v10006-010-0014-6

Schlüsselwörter
RAM testing, pattern sensitive faults, March tests, multibackground testing

This content is open access.

Analysis of multibackground memory testing techniques

Online veröffentlicht: 25. März 2010

Seitenbereich: 191 - 205

DOI: https://doi.org/10.2478/v10006-010-0014-6

SchlüsselwörterRAM testing, pattern sensitive faults, March tests, multibackground testing

This content is open access.

Schlüsselwörter
RAM testing, pattern sensitive faults, March tests, multibackground testing