Electrical Properties of Recessed Algan/Gan Schottky Diodes Under off–State Stress

Electrical properties of recessed and non-recessed AlGaN/GaN Schottky diodes under off-state stress were investigated. The samples were consecutively stressed by the stepped negative bias (−60 V). Before and after the stress I−V and C−V characteristics were evaluated to verify the device degradation process. Finally, the degradation mechanism and the influence of AlGaN recessed layer thickness on the electrical properties of the Schottky diodes were analysed. It was found that the short time stress influence on I−V characteristics was most negligible for the non-recessed sample. Shallow and deep recessed samples exhibited initial trap filling and reverse current decrease. Generally it was found that the stress voltage near 60 V caused recoverable device degradation