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A Method for ADC Error Testing and its Compensation in Ratiometric Measurements

K. Hariharan

K. Hariharan

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Hariharan, K.
, 
P. Vasanthakumar

P. Vasanthakumar

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Vasanthakumar, P.
, 
G. Varun

G. Varun

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Varun, G.
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V. Abhaikumar

V. Abhaikumar

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Abhaikumar, V.
  
May 14, 2010
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Published Online: May 14, 2010
Page range: 56 - 59
DOI: https://doi.org/10.2478/v10048-010-0009-3
Keywords
This content is open access.
Hariharan, K.
Vasanthakumar, P.
Varun, G.
Abhaikumar, V.
Language:
English
Publication timeframe:
6 times per year
Journal Subjects:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing
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