1. bookVolume 31 (2013): Issue 4 (October 2013)
Journal Details
License
Format
Journal
eISSN
2083-134X
ISSN
2083-1331
First Published
16 Apr 2011
Publication timeframe
4 times per year
Languages
English
access type Open Access

Identification of growth mechanism of CBD CIAS thin films from SEM analysis

Published Online: 15 Dec 2013
Volume & Issue: Volume 31 (2013) - Issue 4 (October 2013)
Page range: 506 - 515
Journal Details
License
Format
Journal
eISSN
2083-134X
ISSN
2083-1331
First Published
16 Apr 2011
Publication timeframe
4 times per year
Languages
English
Abstract

Near stoichiometric and stoichiometric CuIn(1−x)Al(x)Se2 (CIAS) thin films have been prepared by chemical bath deposition (CBD) technique. X-ray diffraction (XRD) and energy dispersive x-ray analysis (EDAX) spectra have been employed to confirm the structure and composition of the prepared films. SEM analysis of near-stoichiometric and stoichiometric CIAS thin films enabled us to estimate the grain size, to identify the growth mechanism and also to visualize the surface morphology. Transmittance spectra have been employed to determine the type of transition and other optical parameters such as absorption coefficient, extinction coefficient, dielectric constant, refractive index, Sellmeier parameters and bandgap which are reported in this paper in detail.

Keywords

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