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Journals
Measurement Science Review
Volume 22 (2022): Issue 5 (October 2022)
Open Access
Automatic Detection of Chip Pin Defect in Semiconductor Assembly Using Vision Measurement
Shengfang Lu
Shengfang Lu
,
Jian Zhang
Jian Zhang
,
Fei Hao
Fei Hao
and
Liangbao Jiao
Liangbao Jiao
| Aug 05, 2022
Measurement Science Review
Volume 22 (2022): Issue 5 (October 2022)
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Published Online:
Aug 05, 2022
Page range:
231 - 240
Received:
Nov 25, 2021
Accepted:
May 22, 2022
DOI:
https://doi.org/10.2478/msr-2022-0029
Keywords
3D reconstruction
,
chip pin
,
defect detection
,
feature extraction
,
computer vision
© 2022 Shengfang Lu et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Shengfang Lu
Artificial intelligence Industrial Technology Research Institute, Nanjing Institute of Technology
Nanjing, China
Jiangsu Engineering Research Center of IntelliSense Technology and System, Nanjing Institute of Technology
Nanjing, China
Jian Zhang
Shool of Information and Communication Engineering, Nanjing Institute of Technology
Nanjing, China
Fei Hao
Shool of Mechanical Engineering, Nanjing Institute of Technology
Nanjing, China
Liangbao Jiao
Artificial intelligence Industrial Technology Research Institute, Nanjing Institute of Technology
Nanjing, China
Jiangsu Engineering Research Center of IntelliSense Technology and System, Nanjing Institute of Technology
Nanjing, China