Some remarks on the paper “Optimization of S:Sn precursor molar concentration on the physical properties of spray deposited single phase Sn₂S₃ thin films” by J. Srivind, V.S. Nagaretthinam, A.R. Balu [Mater. Sci.-Poland, 34 (2016), 393 – 398]

Published Online: Dec 12, 2020

Page range: 400 - 401

Received: Apr 14, 2018

Accepted: Nov 13, 2018

DOI: https://doi.org/10.2478/msp-2018-0101

Keywords

X-ray diffraction, thin films, errors, SnS

© 2020 Paweł E. Tomaszewski, published by Sciendo

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