Open Access

Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors

Rudolf Kinder

Rudolf Kinder

Search for this author on
Sciendo|Google Scholar
Kinder, Rudolf
, 
Miroslav Mikolášek

Miroslav Mikolášek

Search for this author on
Sciendo|Google Scholar
Mikolášek, Miroslav
, 
Daniel Donoval

Daniel Donoval

Search for this author on
Sciendo|Google Scholar
Donoval, Daniel
, 
Jaroslav Kováč

Jaroslav Kováč

Search for this author on
Sciendo|Google Scholar
Kováč, Jaroslav
 and 
Marek Tlaczala

Marek Tlaczala

Search for this author on
Sciendo|Google Scholar
Tlaczala, Marek
  
Apr 19, 2013
Measurement Systemwith Hall and a Four Point Probes for Characterization of Semiconductors's Cover Image
About this article
Previous Article
Next Article
Cite
Download Cover
Published Online: Apr 19, 2013
Page range: 106 - 111
DOI: https://doi.org/10.2478/jeec-2012-0015
Keywords
This content is open access.
Kinder, Rudolf
Mikolášek, Miroslav
Donoval, Daniel
Kováč, Jaroslav
Tlaczala, Marek
Language:
English
Publication timeframe:
6 times per year
Journal Subjects:
Engineering, Introductions and Overviews, Engineering, other
Journal RSS Feed