Investigation Of Helium Implanted Fe–Cr Alloys By Means Of X–Ray Diffraction And Positron Annihilation Spectroscopy
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Dec 05, 2015
About this article
Published Online: Dec 05, 2015
Page range: 334 - 338
Received: Jul 03, 2014
DOI: https://doi.org/10.2478/jee-2015-0055
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© 2015 Faculty of Electrical Engineering and Information Technology, Slovak University of Technology
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
X-ray diffraction (XRD) and positron annihilation spectroscopy (PAS) have been used for the characterization of the two binary alloys Fe-Cr with Cr content 2.36 and 8.39 wt%. The influence of ion implantation on these alloys was studied. Different implantation doses of helium, up to 0.5 C/cm2, were used to simulate neutron-induced damage in a sub-surface region. To characterize the damage, a lattice parameter, coherent domain size, residual stress and a crystallographic texture have been studied by grazing incidence X-ray diffraction (GIXRD). It was found out that these parameters showed a similar dependence on the implantation dose as the positron lifetime determined by positron annihilation spectroscopy.