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Journals
International Journal on Smart Sensing and Intelligent Systems
Volume 7 (2014): Issue 5 (January 2014)
Open Access
Inspection of Packaged Integrated Circuits using Terahertz Radiation
Andreas Fritz
Andreas Fritz
and
Thomas Arnold
Thomas Arnold
| Feb 15, 2020
International Journal on Smart Sensing and Intelligent Systems
Volume 7 (2014): Issue 5 (January 2014)
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Published Online:
Feb 15, 2020
Page range:
1 - 4
DOI:
https://doi.org/10.21307/ijssis-2019-056
Keywords
terahertz
,
Time domain spectroscopy
,
Wavelet transformation
,
Wavelet denosing
,
packaged integrated circuit inspection
© 2019 Andreas Fritz et al., published by Sciendo.
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Andreas Fritz
CTR Carinthian Tech Research AG Villach
Villach, Austria
Thomas Arnold
CTR Carinthian Tech Research AG Villach
Villach, Austria