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Multi-algorithmic Palmprint Authentication System Based on Score Level Fusion

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Elango, G. Arul

Sep 05, 2018

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International Journal on Smart Sensing and Intelligent Systems

Volume 11 (2018): Issue 1 (January 2018)

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Article Category: Research-Article

Published Online: Sep 05, 2018

Page range: 1 - 11

DOI: https://doi.org/10.21307/ijssis-2018-006

Keywords
Contourlet transform, Dual-Tree Complex Wavelet Transform, equal error rate, false acceptance rate, genuine acceptance rate, principal component analysis, Support Vector Machine

© 2018 C. Murukesh et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Murukesh, C.

Department of Electronics and Instrumentation Engineering, Velammal Engineering CollegeChennai, India

Elango, G. Arul

Department of ECE, Sree Vidyanikethan Engineering CollegeTirupathi, India

Language:: English

Publication timeframe:: 1 times per year
Journal Subjects:: Engineering, Introductions and Overviews, Engineering, other

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