Electronic parameters of MIS Schottky diodes with DNA biopolymer interlayer

[1] KOEZUKA H., ETOH S., J. Appl. Phys., 54 (5) (1983), 2511.10.1063/1.332318Search in Google Scholar

[2] KURATA T., KOEZUKA H., TSUNODA S., ANDO T., J. Phys. D Appl. Phys., 19 (4) (1986), L57.10.1088/0022-3727/19/4/003Search in Google Scholar

[3] TURUT A., KOLELI F., J. Appl. Phys., 72 (2) (1992), 818.10.1063/1.351822Search in Google Scholar

[4] ONGANER Y., SAGLAM M., TURUT A., EFEOGLU H., TUZEMEN S., Solid State Electron., 39 (1996), 677.10.1016/0038-1101(95)00158-1Search in Google Scholar

[5] GUPTA R., MISRA S.C.K., MALHOTRA B.D., BELADAKERE N.N., CHANDRA S., Appl. Phys. Lett., 58 (1991), 51.10.1063/1.104441Search in Google Scholar

[6] AYDOGAN S., SAGLAM M., TURUT A., J. Phys.- Condens. Mat., 18 (9) (2006), 2665.10.1088/0953-8984/18/9/006Search in Google Scholar

[7] CAMAIONI N., CASALBORE-MICELI G., BEGGIATO G., CRISTANI M., SUMMONTE C., Thin Solid Films, 366 (2000), 211.10.1016/S0040-6090(99)01103-7Search in Google Scholar

[8] FORREST S.R., SCHMIDT P.H., J. Appl. Phys., 59 (1986), 513.10.1063/1.336662Search in Google Scholar

[9] GULLU O., PAKMA O., TURUT A., J. Appl. Phys., 111 (2012), 044503.10.1063/1.3684989Search in Google Scholar

[10] SAMUEL M., MENON C.S., UNNIKRISHNAN N.V., Mater. Sci.-Poland, 25 (1) (2007), 177.Search in Google Scholar

[11] KILICOGLU T., AYDIN M.E., OCAK Y.S., Physica B, 388 (1, 2) (2007), 244.10.1016/j.physb.2006.06.126Search in Google Scholar

[12] KAMPEN T., SCHULLER A., ZAHN D.R. T., BIEL B., ORTEGA J., PEREZ R., FLORES F., Appl. Surf. Sci., 234 (2004), 341.10.1016/j.apsusc.2004.05.257Search in Google Scholar

[13] ZAHN D.R.T., KAMPEN T.U., MENDEZ H., Appl. Surf. Sci., 212 - 213 (2003), 423.10.1016/S0169-4332(03)00125-9Search in Google Scholar

[14] ROBERTS A.R.V., EVANS D.A., Appl. Phys. Lett., 86 (2005), 072105.10.1063/1.1864255Search in Google Scholar

[15] BOLOGNESI A., CARLO A.D., LUGLI P., KAMPEN T., ZAHN D.R.T., J. Phys.: Condens. Mat., 15 (2003), S2719.10.1088/0953-8984/15/38/010Search in Google Scholar

[16] RAJESH K.R., MENON C.S., J. Non-Cryst. Solids, 353 (4) (2007), 398.10.1016/j.jnoncrysol.2006.12.016Search in Google Scholar

[17] FORREST S.R., KAPLAN M.L., SCHMIDT P.H., FELDMANN W.L., YANOWSKI E., Appl. Phys. Lett., 41 (1982), 90.10.1063/1.93300Search in Google Scholar

[18] CAKAR M., TEMIRCI C., TURUT A., Chemphyschem, 8 (2002), 701.10.1002/1439-7641(20020816)3:8<701::AID-CPHC701>3.0.CO;2-RSearch in Google Scholar

[19] AYDIN M.E., KILICOGLU T., AKKILIC K., HOSGOREN H., Physica B, 381 (2006), 113.10.1016/j.physb.2005.12.254Search in Google Scholar

[20] FORREST S.R., KAPLAN M.L., SCHMIDT P.H., J. Appl. Phys., 55 (1984), 1492.10.1063/1.333407Search in Google Scholar

[21] ANTOHE S., TOMOZEIU N., GOGONEA S., Phys. Status Solidi A, 125 (1991), 397.10.1002/pssa.2211250138Search in Google Scholar

[22] EBEOGLU M.A., KILICOGLU T., AYDIN M.E., Physica B, 395 (2007), 93.Search in Google Scholar

[23] HATTORI K., TORII Y., Solid State Electron., 34 (1991), 527.10.1016/0038-1101(91)90157-TSearch in Google Scholar

[24] SUGIUO T., SAKAMOTO Y., SUMIGUCHI T., NOMOTO K., SHIRAFUJI J., Jpn. J. Appl. Phys., 32 (1993), L1196.10.1143/JJAP.32.L1196Search in Google Scholar

[25] SAKAMOTO Y., SUGINO T., MIYAZAKI T., SHIRAFUJI J., Electron. Lett., 31 (1995), 1104.10.1049/el:19950756Search in Google Scholar

[26] GULLU O., TURUT A., Sol. Energ. Mat. Sol. C., 92 (10) (2008), 1295.Search in Google Scholar

[27] BHALLA V., BAJPAI R. P., BHARADWAJ L.M., EMBO Rep., 4 (5) (2003), 442.10.1038/sj.embor.embor834131918912728239Search in Google Scholar

[28] HWANG J.S., HWANG S.W., AHN D., Superlattice. Microst., 4 (2003), 433.10.1016/j.spmi.2004.03.064Search in Google Scholar

[29] PORATH D., BEZRYADIN A., VRIES DE S., DEKKER C., Nature, 403 (2000), 635.10.1038/3500102910688194Search in Google Scholar

[30] KASUMOV A.Y., KOCIAK M., GUERON S., REULET B., VOLKOV V.T., KLINOV D.V., BOUCHIAT H., Science, 291 (2001), 280.10.1126/science.291.5502.28011209072Search in Google Scholar

[31] YOO K.H., HA D.H., LEE J.O., PARK J.W., KIM J., KIM J.J., LEE H.Y., KAWAI T., CHOI H.Y., Phys. Rev. Lett., 87 (2001), 198102.10.1103/PhysRevLett.87.19810211690458Search in Google Scholar

[32] HWANG J.S., KONG K.J., AHN D., LEE G.S., AHN D.J., HWANG S.W., Appl. Phys. Lett., 81 (2002), 1134.10.1063/1.1498862Search in Google Scholar

[33] LI X.Q., YAN Y., J., Appl. Phys. Lett., 79 (2001), 2190.10.1063/1.1407860Search in Google Scholar

[34] STORM A.J., VAN NOORT J., VRIES DE S., DEKKER C., Appl. Phys. Lett., 79 (2001), 3881.10.1063/1.1421086Search in Google Scholar

[35] CAI L., TABATA H., KAWAI T., Appl. Phys. Lett., 77 (2000), 3105.10.1063/1.1323546Search in Google Scholar

[36] FINK H.W., SCHONENBERGER C., Nature, 398 (1999), 407.10.1038/18855Search in Google Scholar

[37] JO Y.S., LEE Y., ROH Y., Mater. Sci. Eng. C, 23 (2003), 841.10.1016/j.msec.2003.09.107Search in Google Scholar

[38] ENDRES R.G., COX D.L., SINGH R.R.P., Rev. Mod. Phys., 76 (2004), 195.10.1103/RevModPhys.76.195Search in Google Scholar

[39] KWOK H.L., IET Nanobiotechnol., 151 (6) (2004), 193. 10.1049/ip-nbt:20045007Search in Google Scholar

[40] QIU Y., QIAO J., Thin Solid Films, 372 (2000), 265.10.1016/S0040-6090(00)01007-5Search in Google Scholar

[41] RHODERICK E.H., WILLIAMS R.H., Metal- Semiconductor Contacts, Clarendon, Oxford, 1988.Search in Google Scholar

[42] SZE S.M., Physics of Semiconductor Devices, Wiley, New York, 1981.Search in Google Scholar

[43] SCHMITSDORF R.F., KAMPEN T.U., MONCH W., J. Vac. Sci. Technol. B, 15 (4) (1997), 1221.10.1116/1.589442Search in Google Scholar

[44] MONCH W., J. Vac. Sci. Technol. B, 17 (4) (1999), 1867.10.1116/1.590839Search in Google Scholar

[45] TUNG R.T., Phys. Rev. B, 45 (23) (1992), 13509.10.1103/PhysRevB.45.1350910001439Search in Google Scholar

[46] VANALME G.M., GOUBERT L., MEIRHAEGHE VAN R.L., CARDON F., DAELE VAN P., Semicond. Sci.Tech., 14 (1999), 871.10.1088/0268-1242/14/9/321Search in Google Scholar

[47] CAKAR M., TEMIRCI C., TURUT A., Synthetic Met., 142 (2004), 177.10.1016/j.synthmet.2003.08.009Search in Google Scholar

[48] ZAHN D.R.T., PARK S., KAMPEN T.U., Vacuum, 67 (2002), 101.10.1016/S0042-207X(02)00185-9Search in Google Scholar

[49] MEIRHAEGHE VAN R.L., LAFLERE W.H., CARDON F., J. Appl. Phys., 76 (1) (1994), 403. 10.1063/1.357089Search in Google Scholar

[50] AYDOGAN S., SAGLAM M., TURUT A., Microelectron. Eng., 85 (2008), 278.Search in Google Scholar

[51] CHEUNG S.K., CHEUNG N.W., Appl. Phys. Lett., 49 (1986), 85.10.1063/1.97359Search in Google Scholar

[52] TURUT A., SAGLAM M., EFEOGLU H., YALCIN N., YILDIRIM M., ABAY B., Physica B, 205 (1995), 41.10.1016/0921-4526(94)00229-OSearch in Google Scholar

[53] KILICOGLU T., Thin Solid Films, 516 (2008), 967.10.1016/j.tsf.2007.06.022Search in Google Scholar

[54] KARATAS S., ALTINDAL S., TURUT A., CAKAR M., Physica B, 392 (1 - 2) (2007), 43.Search in Google Scholar

[55] WERNER J.H., GUTTLER H.H., J. Appl. Phys., 69 (1991), 1522.10.1063/1.347243Search in Google Scholar

[56] GULLU O., AYDOGAN S., TURUT A., Microelectron.Eng., 85 (2008), 1647.Search in Google Scholar

[57] CARD H.C., RHODERICK E.H., J. Phys. D Appl. Phys., 4 (1971), 1589. 10.1088/0022-3727/4/10/319Search in Google Scholar