[[1] AMBIA M.G., ISLAM M.N., OBAIDUL HAKIM M., Sol. Ener. Mat. Sol. C., 28 (2) (1992), 103.10.1016/0927-0248(92)90002-7]Search in Google Scholar
[[2] GOYAL D.J., AGASHE C., TAKWALE M.G., MARATHE B.R., BHIDE V.G., J. Mater. Sci., 27 (17) (1992), 4705.10.1007/BF01166010]Search in Google Scholar
[[3] BAKHA Y., BENDIMERAD K.M., HAMZAOUI S., Eur.Phys. J. - Appl. Phys., 55 (2011), 30103.10.1051/epjap/2011110072]Search in Google Scholar
[[4] FAY S., SHAH A., Zinc Oxide Grown by CVD Process as Transparent Contact for Thin Film Solar Cell Applications, in: ELLMER K., KLEIN A., RECH B., (Eds.) Transparent Conductive Zinc Oxide. Basics and Applications in Thin Film Solar Cells, Springer Series in Materials Science, Vol. 104, Springer Berlin Heidelberg, 2008, pp. 235 - 302.10.1007/978-3-540-73612-7_6]Search in Google Scholar
[[5] BOUDERBALA M., HAMZAOUI S., STAMBOULI A.B., BOUZIANE H., Appl. Energ., 64 (1 - 4) (1999), 89.10.1016/S0306-2619(99)00047-1]Search in Google Scholar
[[6] ZHANG X.-A., ZHANG J.-W., ZHANG W.-F., WANG D., BI Z., BIAN X.-M., HOU X., Thin Solid Films, 516 (10) (2008), 3305.10.1016/j.tsf.2007.09.034]Search in Google Scholar
[[7] KAMALASANAN M.N., CHANDRA S., Thin Solid Films, 288 (1 - 2) (1996), 112.10.1016/S0040-6090(96)08864-5]Search in Google Scholar
[[8] OLVERA DE LA M.L., MALDONADO A., VEGA PEREZ J., SOLORZA-FERIA O., Mater. Sci. Eng. BAdv., 174 (1 - 3) (2010), 42.10.1016/j.mseb.2010.03.074]Search in Google Scholar
[[9] DUTTA V., Energy Procedia, 3 (2011), 58.10.1016/j.egypro.2011.01.010]Search in Google Scholar
[[10] VIMALKUMAR T.V., POORNIMA N., SUDHA KARTHA C., VIJAYAKUMAR K.P., Appl. Surf. Sci., 256 (20) (2010), 6025.10.1016/j.apsusc.2010.03.113]Search in Google Scholar
[[11] ASHOUR A., KAID M.A., EL-SAYED N.Z., IBRAHIM A.A., Appl. Surf. Sci., 252 (22) (2006), 7844.10.1016/j.apsusc.2005.09.048]Search in Google Scholar
[[12] BANERJEE A.N., GOSH C.K., CHATTOPADHYA K.K., MINOURA H., SARKAR A.K., AKIBA A., KAMIYA A., ENDO T., Thin Solid Films, 496 (1) (2006), 112.10.1016/j.tsf.2005.08.258]Search in Google Scholar
[[13] KIM H.W., KIM N.H., LEE C., RYU J.H., LEE N.E., J. Korean Phys. Soc., 44 (2004), 14.]Search in Google Scholar
[[14] MA T.Y., KIM S.H., MOON H.Y., PARK G.C., KIM Y.J., KIM K.W., Jpn. J. Appl. Phys., 35 (1996), 6208.10.1143/JJAP.35.6208]Search in Google Scholar
[[15] FAN X.M., LIAN J.S., GUO Z.X., LU H.J., J. Cryst. Growth, 279 (2005), 447.10.1016/j.jcrysgro.2005.02.065]Search in Google Scholar
[[16] BANERJEE A.N., GHOSH C.K., CHATTOPADHYAY K.K., MINOURA H., SARKAR A.K., AKIBA A., KAMIYA A., ENDO T., Thin Solid Films, 496 (2006), 112.10.1016/j.tsf.2005.08.258]Search in Google Scholar
[[17] DIKOVSKA A.O., ATANASOV P.A., VASILEV C., DIMITROV I.G., STOYANCHOV T.R., J. Optoelectron. Adv. M., 7 (2005), 1329.]Search in Google Scholar
[[18] SCHERRER P., Nachr. Ges. Wiss. Göttingen, 2 (1918), 96.]Search in Google Scholar
[[19] SCHRODER D.K., Semiconductor Material and Device Characterization, Wiley, New York, 1990.]Search in Google Scholar
[[20] CULLITY B.D., Elements of X-ray Diffraction, Addison-Wesley, Reading, MA, 1978, p. 102.]Search in Google Scholar
[[21] PRASADA RAO T., SANTHOSH KUMAR M.C., ANBUMOZHI ANGAYARKANNI S., ASHOK M., J. Alloy. Compd., 485 (1 - 2) (2009), 413.10.1016/j.jallcom.2009.05.116]Search in Google Scholar
[[22] ILICAN S., CAGLAR M., CAGLAR Y., Mater. Sci.- Poland, 25 (2007), 715.]Search in Google Scholar
[[23] CRACIUN V., PERRIERE J., BASSIM N., SINGH R.K., CRACIUN D., SPEAR J., Appl. Phys. A, 25 (1999), 531. 10.1007/s003390051463]Search in Google Scholar