1. bookVolume 33 (2015): Issue 1 (March 2015)
Journal Details
License
Format
Journal
eISSN
2083-134X
First Published
16 Apr 2011
Publication timeframe
4 times per year
Languages
English
Open Access

Influence of duration time of CVD process on emissive properties of carbon nanotubes films

Published Online: 13 Mar 2015
Volume & Issue: Volume 33 (2015) - Issue 1 (March 2015)
Page range: 36 - 46
Received: 11 Mar 2014
Accepted: 19 Nov 2014
Journal Details
License
Format
Journal
eISSN
2083-134X
First Published
16 Apr 2011
Publication timeframe
4 times per year
Languages
English
Abstract

In this paper various types of films made of carbon nanotubes (CNTs) are presented. These films were prepared on different substrates (Al2O3, Si n-type) by the two-step method. The two-step method consists of physical vapor deposition step, followed by chemical vapor deposition step (PVD/CVD). Parameters of PVD process were the same for all initial films, while the duration times of the second step - the CVD process, were different (15, 30 min.). Prepared films were characterized by scanning electron microscopy (SEM), transmission electron microscopy (TEM) and field emission (FE) measurements. The I-E and F-N characteristics of electron emission were discussed in terms of various forms of CNT films. The value of threshold electric field ranged from few V/μm (for CNT dispersed rarely on the surface of the film deposited on Si) up to ~20 V/μm (for Al2O3 substrate).

Keywords

[1] CHEN J., ZHOU X., DENG S.Z., XU N.S., Ultramicroscopy, 95 (2003), 153.10.1016/S0304-3991(02)00310-8Search in Google Scholar

[2] YUE G.Z., QIU Q., GAO B., CHENG Y., ZHANG J., SHIMODA H., CHANG S., LU J.P., ZHOU O., Appl. Phys. Lett., 81 (2) (2002), 355.10.1063/1.1492305Search in Google Scholar

[3] SARRAZIN P., BLAKE D., DELZEIT L., MEYYAPPAN M., BOYER B., SNYDER S., ESPINOSA B., Adv. X-Ray Anal., 47 (2004), 232.Search in Google Scholar

[4] READ M.E., SCHWARZ W.G., KREMER M.J., LENNHOFF J.D., CARNAHAN D.L., KEMPA K., REN Z.F., PAC 2001 Proc., (2001), 1026.Search in Google Scholar

[5] SILAN J.L., NIEMANN D.L., RIBAYA B.P., RAHMAN M., MEYYAPPAN M., NGUYEN C.V., Solid-State Electron., 54 (2010), 1543.10.1016/j.sse.2010.07.004Search in Google Scholar

[6] OK-JOO L., KUN-HONG L., Appl. Phys. Lett., 82 (2003), 3770.10.1063/1.1578520Search in Google Scholar

[7] JONGE N., BONARD J.M., Philos. T. R. Soc. A, 362, (2004), 2239.10.1098/rsta.2004.1438Search in Google Scholar

[8] FILIP V., NICOLAESCU D., TANEMURA M., OKUYAMA F., Ultramicroscopy, 89 (2001), 39.10.1016/S0304-3991(01)00107-3Search in Google Scholar

[9] JONGE N., DRUTEN N.J., Ultramicroscopy, 95 (2003), 85.10.1016/S0304-3991(02)00301-7Search in Google Scholar

[10] NAKAHARA H., KUSANO Y., KONO T., SAITO Y., Appl. Surf. Sci., 256 (2009), 1214.10.1016/j.apsusc.2009.05.105Search in Google Scholar

[11] GRONING P., RUFFIEUX P., SCHLAPBACH L., GRONING O., Adv. Eng. Mater., 5 (2003), 541.10.1002/adem.200310098Search in Google Scholar

[12] BONARD J.-M., CROCI M., ARFAOUI I., NOURY O., SARANGI D., CHATELAIN A., Diam. Relat. Mater., 11 (2002), 763.10.1016/S0925-9635(01)00541-6Search in Google Scholar

[13] NILSSON L., GROENING O., EMMENEGGER C., KUETTEL O., SCHALLER E., SCHLAPBACH L., KIND H., BONARD J-M., KERN K., Appl. Phys. Lett., 76 (15) (2000), 2071.10.1063/1.126258Search in Google Scholar

[14] WANGA X.Q., WANGA M., LIB Z.H., XUA Y.B., HE P.M., Ultramicroscopy, 102 (2005), 181.10.1016/j.ultramic.2004.08.009Search in Google Scholar

[15] POGORELOV E.G., CHANG Y.C., ZHBANOV A.I., YONG-GU L., J. Appl. Phys., 108 (2010), 044502.10.1063/1.3466992Search in Google Scholar

[16] SAITO Y., UEMURA S., Carbon, 38 (2000), 169.10.1016/S0008-6223(99)00139-6Search in Google Scholar

[17] BONARD J.M., STOCKLI T., NOURY O., CHATELAIN A., Appl. Phys. Lett., 78 (2001), 2775.10.1063/1.1367903Search in Google Scholar

[18] KOZŁOWSKI M., DŁU˙Z EWSKI P., KOWALSKA E., CZERWOSZ E., Cent. Eur. J. Phys., 9 (2) (2011), 344.10.2478/s11534-010-0106-9Search in Google Scholar

[19] KOWALSKA E., KOWALCZYK P., RADOMSKA J., CZERWOSZ E., WRONKA H., BYSTRZEJEWSKI M., J. Therm. Anal. Calorim., 86 (2006), 115.10.1007/s10973-006-7585-3Search in Google Scholar

[20] CZERWOSZ E., DŁU˙ZEWSKI P., NOWAKOWSKI R., WRONKA H., Vacuum, 48 (1997), 357.10.1016/S0042-207X(96)00289-8Search in Google Scholar

[21] KOWALSKA E., CZERWOSZ E., DŁU˙ZEWSKI P.A., KOZŁOWSKI M., RADOMSKA J., Diam. Relat. Mater., 13 (2004), 1008.10.1016/j.diamond.2004.01.004Search in Google Scholar

[22] SINNOTT S.B., ANDREWS R., QIAN D., RAO A.M., MAO Z., DICKEY E.C., DERBYSHIRE F., Chem. Phys. Lett., 315 (1999), 25.10.1016/S0009-2614(99)01216-6Search in Google Scholar

[23] DE JONGE N., BONARD J.-M., Philos. T. R. Soc. A, 362 (2004), 2239.10.1098/rsta.2004.143815370480Search in Google Scholar

Recommended articles from Trend MD

Plan your remote conference with Sciendo