[Bergerhoff G, Berndt M, Brandenburg (1996) J. Res. Natl Inst. Stand. Technol. 101: 221.]Search in Google Scholar
[Bertolotti F, Forni A, Gervasio G, Marabello D, Diana E (2012) Polyhedron 42: 118.10.1016/j.poly.2012.05.005]Search in Google Scholar
[Blessing RH (1995) Acta Cryst. A51: 33]Search in Google Scholar
[Dolomanov OV, Bourhis LJ, Gildea RJ, Howard JAK, Puschmann H (2009) J. Appl. Cryst. 42: 339.10.1107/S0021889808042726]Search in Google Scholar
[Farrugia LJ (2012) J. Appl. Cryst. 45: 849.10.1107/S0021889812029111]Search in Google Scholar
[Fronczek FR (2003) Private CSD Communication.]Search in Google Scholar
[Golzar Hossain GM (2007) Private CSD Communication.]Search in Google Scholar
[Mahmoudkhani AH, Langer V (1998) Private CSD Communication.]Search in Google Scholar
[Nieger M (2001) Private CSD Communication.]Search in Google Scholar
[Palatinus L, Chapuis G (2007) J. Appl. Cryst. 40: 786.10.1107/S0021889807029238]Search in Google Scholar
[Shamuratov EB, Batsanov AS, Sharipov KhT, Struchkov YuT, Azizov T (1994) Koord. Khim. (Russ.) (Coord. Chem.) 20: 754.]Search in Google Scholar
[Sheldrick GM (2015) Acta Cryst. C71: 3.10.1107/S2053229614024218429432325567568]Search in Google Scholar
[STOE & Cie GmbH (2016). X-Area 1.76, software package for collecting single-crystal data on STOE area-detector diffractometers, for image processing, scaling reflection intensities and for outlier rejection; Darmstadt, Germany.]Search in Google Scholar
[STOE & Cie GmbH (2013). X-View 2.1.7, program for monitoring and centering a sample on a STOE X-ray diffractometer in combination with a magnifying video camera, and for graphics-supported determination of a crystal-shape model; Darmstadt, Germany.]Search in Google Scholar
[Vaughan GBM, Schmidt S, Poulsen HF (2004) Z. Kristallogr. 219: 813.]Search in Google Scholar
