INFORMAZIONI SU QUESTO ARTICOLO
S. Sadana
Electronics and Electrical Engineering Department (EEED), Thapar University, Patiala, Punjab, India
S. Yadav
National Physical Laboratory (NPLI), Council of Scientific and Industrial Research (CSIR), New Delhi - 110 012, India
N. Jha
Department of Electronics, University of Delhi South Campus, New Delhi 110 021, India
V. Gupta
National Physical Laboratory (NPLI), Council of Scientific and Industrial Research (CSIR), New Delhi - 110 012, India
R. Agarwal
National Physical Laboratory (NPLI), Council of Scientific and Industrial Research (CSIR), New Delhi - 110 012, India
A. Bandyopadhyay
National Physical Laboratory (NPLI), Council of Scientific and Industrial Research (CSIR), New Delhi - 110 012, India
T. Saxena
National Physical Laboratory (NPLI), Council of Scientific and Industrial Research (CSIR), New Delhi - 110 012, India
eISSN:
1335-8871
Lingua:
Inglese
Frequenza di pubblicazione:
6 volte all'anno
Argomenti della rivista:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing