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Integral Nonlinearity Correction Algorithm Based on Error Table Optimizing and Noise Filtering

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Cita

IEEE Std. 1241-2000 (2001). IEEE Standard for Terminology and Test Methods for Analog-Digital Converters. E-ISBN: 0-7381-2725-6.Search in Google Scholar

Arpaia, P., Daponte, P., Michaeli, L. (1999). A dynamic error model for integrating analog-to-digital converters. Measurement 25, 255-264.10.1016/S0263-2241(99)00010-XSearch in Google Scholar

Ludin, H. (2003). Post-Correction of Analog-to-Digital Converters. Licentiate thesis, Royal Institute of Technology, Stockholm, TRITA-S3-SB-0324.Search in Google Scholar

Wannamaker, R. A., Lipshitz, S. P., Vanderkooy, J. A. (2000). Theory of non-subtractive dither. IEEE Transactions on Signal Processing 48, 499-516.10.1109/78.823976Search in Google Scholar

Serra, A. C., da Silva, M. F., Ramos, P. M., Martins, R. C., Michaeli, L., Šaliga, J. (2005). Combined spectral and histogram analysis for fast ADC testing. IEEE Transactions on Instrumentation and Measurement 54 (4), 1617-1623.10.1109/TIM.2005.851057Search in Google Scholar

eISSN:
1335-8871
Lingua:
Inglese
Frequenza di pubblicazione:
6 volte all'anno
Argomenti della rivista:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing