<abstract xmlns="http://www.w3.org/1999/xhtml">Electron paramagnetic resonance (EPR) measurements have been made for two perpendicular planes in a LiYF4 crystal before and after x-ray irradiation at room temperature. Analysis of the EPR spectrum angular dependence shows the presence of two defects - an impurity ion, which was embedded during the crystal growth process, and an x-ray induced defect with the g-factor of approx. 2.0. Spectral parameters and possible defect models are discussed.</abstract>

Electron paramagnetic resonance (EPR) measurements have been made for two perpendicular planes in a LiYF4 crystal before and after x-ray irradiation at room temperature. Analysis of the EPR spectrum angular dependence shows the presence of two defects - an impurity ion, which was embedded during the crystal growth process, and an x-ray induced defect with the g-factor of approx. 2.0. Spectral parameters and possible defect models are discussed.

Epr Spectrum Angular Dependences In Liyf4 Crystal / Epr Spektru Leņķiskās Atkarības Liyf4 Kristālā

Institute of Solid State Physics, University of Latvia, 8 Ķengaraga Str., Rīga, LV-1063, LATVIA

Latvian Journal of Physics and Technical Sciences

Epr Spectrum Angular Dependences In Liyf Crystal / Epr Spektru Leņķiskās Atkarības Liyf Kristālā

Electron paramagnetic resonance (EPR) measurements have been made for two perpendicular planes in a LiYF4 crystal before and after x-ray irradiation at room...

Epr Spectrum Angular Dependences In Liyf₄ Crystal / Epr Spektru Leņķiskās Atkarības Liyf₄ Kristālā

Pubblicato online: 01 feb 2013

Pagine: 49 - 54

DOI: https://doi.org/10.2478/v10047-012-0034-0

This content is open access.