Accesso libero

Influence of Bi2O3 addition on structure and dielectric properties of Ag(Nb0.8Ta0.2)O3 ceramics

INFORMAZIONI SU QUESTO ARTICOLO

Cita

[1] DESU S.B., O’BRYAN H.M., J. Am. Ceram. Soc., 68(10) (1985), 546. http://dx.doi.org/10.1111/j.1151-2916.1985.tb11521.x10.1111/j.1151-2916.1985.tb11521.xSearch in Google Scholar

[2] SUVOROV D., VALANT M., KOLAR D., J. Mater. Sci., 32(1997), 6483. http://dx.doi.org/10.1023/A:101869880828910.1023/A:1018698808289Search in Google Scholar

[3] VALANT M., SUVOROV D., J. Am. Ceram. Soc., 82(1) (1999), 88. http://dx.doi.org/10.1111/j.1151-2916.1999.tb01727.x10.1111/j.1151-2916.1999.tb01727.xSearch in Google Scholar

[4] GUO X.Y., ZHU N., XIAO M., WU X.W., J. Am. Ceram. Soc., 90(8) (2007), 2467. http://dx.doi.org/10.1111/j.1551-2916.2007.01802.x10.1111/j.1551-2916.2007.01802.xSearch in Google Scholar

[5] VALANT M., SUVOROV D., HOFFMANN C., SOMMARIVA H., J. Eur. Ceram. Soc., 21(15) (2001), 2647. http://dx.doi.org/10.1016/S0955-2219(01)00331-410.1016/S0955-2219(01)00331-4Search in Google Scholar

[6] GUO X.Y., XIAO M., WU X.W., ZHANG Z.S., Journal of the Chinese ceramics society, 34(1) (2006), 5. 10.22140/cpar.v1i1.103Search in Google Scholar

[7] HOLTZBERG F., REUSNAB A., J. Phys. Chem., 65(7) (1961), 1192. http://dx.doi.org/10.1021/j100825a02410.1021/j100825a024Search in Google Scholar

[8] MOHANTY G.P., FIEGEL L.J., HEALY J.H., J. Phys. Chem., 68(1) (1964), 208. http://dx.doi.org/10.1021/j100783a50710.1021/j100783a507Search in Google Scholar

[9] VALANT M., SUVOROV D., Mater. Chem. Phy., 79(2003), 104. http://dx.doi.org/10.1016/S0254-0584(02)00248-110.1016/S0254-0584(02)00248-1Search in Google Scholar

[10] TEMPLETON A., WANG X., PENN S.J., WEBB S.J., COHEN L.F., J. Am. Ceram. Soc., 83(1) (2000), 95. http://dx.doi.org/10.1111/j.1151-2916.2000.tb01154.x10.1111/j.1151-2916.2000.tb01154.xSearch in Google Scholar

[11] HEIDINER R., NAZAR S., Powder Metall. Int., 20(6) (1988), 30. PENN S.J., ALFORD N.M., TEMPLETON A., WANG X., XU, M., REECE M., SCHRAPEL K., J. Am. Ceram. Soc., 80(7) (1997), 1885. Search in Google Scholar

[12] SHANNON R.D., J. Appl. Phys., 73(1) (1993), 348. http://dx.doi.org/10.1063/1.35385610.1063/1.353856Search in Google Scholar

[13] IDDLES D.M., BELL A.J. MOULSON A.J., J. Mater. Sci., 27(1992), 6309. http://dx.doi.org/10.1007/BF0057627610.1007/BF00576276Search in Google Scholar

[14] ROSS S.D., J. Phys. C: Solid State. Phys., 3(1970), 1785. http://dx.doi.org/10.1088/0022-3719/3/8/01810.1088/0022-3719/3/8/018Search in Google Scholar

[15] FONTANA M.D., METRAT G., SERVOIN J.L., GERVAIS F., J. Phys. C: Solid State. Phys., 16(1984), 483. http://dx.doi.org/10.1088/0022-3719/17/3/02010.1088/0022-3719/17/3/020Search in Google Scholar

[16] CHEN Y.C., YAO Y.D, HSIEN Y.S., CHENG H.F., CHIA C.T., LIN I.N., J. Electroceram., 13(2004), 281 http://dx.doi.org/10.1007/s10832-004-5113-z10.1007/s10832-004-5113-zSearch in Google Scholar

eISSN:
2083-124X
ISSN:
2083-1331
Lingua:
Inglese
Frequenza di pubblicazione:
4 volte all'anno
Argomenti della rivista:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties